Auto Inspection Process
Auto Inspection Process
Intuitive Recipe Creation
Proprietary Intelligent Algorithm with Rapid Learning to create your own recipe!
Helps user to shorten manual recipe creation time by learning the Region of Interest (ROI) of the devices and to preset the recipe by a few mouse clicks.
All you have to do is to place a good device under the registration region and initiate device tracing. The system learns and presents the acceptable composition of the device’s leadframe, die, and the details of all the wires.
For complex samples, Manual Assisted Learning is available to further enhance your auto learning results with touch-up functions.
With your created recipe and your preset ‘Good’ or ‘NG’ criteria, you’re ready for your automated inspection.
SETTING UP OF INSPECTION RECIPE MADE SIMPLE
LEARN SMART, LEARN FAST
SCANNING AND JUDGING WITH IMPRESSIVE ELEMENTS
IN SPEED AND ACCURACY
RELIABLE DETECTION WITH CLOSE TO
ZERO DEFECT TOLERANCE
Ingenious Auto-Judgement
No defects would be able to escape the judgement based on our stringent parameters and the wide range of defect coverages. High Accuracy and High Throughput with Zero Underkill.
Every sample would be inspected and judged based on the created recipe and preset ‘Good’ and ‘NG’ criteria.
- Missing Wire
- Wire Sweep
- Shorting Wire
- Broken Wire
- Wire Loop
- Wire Sag
- Stray Wire
The proprietary void algorithm could perform inspections at stunning speeds and attain throughput of up to 15,000. Concurrently with the achievement of such amazing speeds, the accuracy is consciously upheld to as low as less than 1% marginal error.
The competency of the algorithm is sensitive to even detect void within void (void-in-void) and flexible enough to split distinct voids apart that are as close as 20 µm or merge them for simplicity reasons.
Multi-shaped Regions of Interest (ROI) and multiple Don’t Care Regions (DCRs) utilities are also available conveniently at your disposal. Voids of interest could be highlighted around their borders or colour-filled interiorly in accordance with your application needs.
Results are generated with comprehensive mapping report or according to customer requirements. Defects marking such as Sticker Labelling, Ink Marking and Laser Marking are also available as options.
Ingenious Auto-Judgement
No defects would be able to escape the judgement based on our stringent parameters and the wide range of defect coverages. High Accuracy and High Throughput with Zero Underkill.
Every sample would be inspected and judged based on the created recipe and preset ‘Good’ and ‘NG’ criteria.
- Missing Wire
- Wire Sweep
- Shorting Wire
- Broken Wire
- Wire Loop
- Wire Sag
- Stray Wire
The proprietary void algorithm could perform inspections at stunning speeds and attain throughput of up to 15,000. Concurrently with the achievement of such amazing speeds, the accuracy is consciously upheld to as low as less than 1% marginal error.
The competency of the algorithm is sensitive to even detect void within void (void-in-void) and flexible enough to split distinct voids apart that are as close as 20 µm or merge them for simplicity reasons.
Multi-shaped Regions of Interest (ROI) and multiple Don’t Care Regions (DCRs) utilities are also available conveniently at your disposal. Voids of interest could be highlighted around their borders or colour-filled interiorly in accordance with your application needs.
Results are generated with comprehensive mapping report or according to customer requirements. Defects marking such as Sticker Labelling, Ink Marking and Laser Marking are also available as options.
SCANNING AND JUDGING WITH IMPRESSIVE ELEMENTS
IN SPEED AND ACCURACY
RELIABLE DETECTION WITH CLOSE TO
ZERO DEFECT TOLERANCE
